Enhanced co-registered optical systems

ABSTRACT

An imaging optical system including a plurality of imaging optical sub-systems, each having at least one optical element and receiving light from a source, and a plurality of spectrometer optical sub-systems, each spectrometer optical sub-system receiving light from at least one of the imaging optical sub-systems, each imaging optical sub-system and spectrometer optical sub-system combination having a spatial distortion characteristic, each spatial distortion characteristic having a predetermined relationship to the other spatial distortion characteristics.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a continuation of co-pending U.S. application Ser.No. 17,135,204, filed on Dec. 28, 2020, entitled ENHANCED CO-REGISTEREDOPTICAL SYSTEMS, which is a continuation of U.S. application Ser. No.16/587,502, filed on Sep. 30, 2019, entitled ENHANCED CO-REGISTEREDOPTICAL SYSTEMS, which is a continuation of U.S. application Ser. No.16/025,233, filed Jul. 2, 2018, now U.S. Pat. No. 10,429,241, which is acontinuation of U.S. application Ser. No. 15/784,510, filed Oct. 16,2017, entitled ENHANCED CO-REGISTERED OPTICAL SYSTEMS, now U.S. Pat. No.10,012,543, which claims priority from U.S. Provisional PatentApplication Ser. No. 62/408,440, filed Oct. 14, 2016, entitled ENHANCEDCO-REGISTERED OPTICAL SYSTEMS, all which are incorporated herein byreference in their entirety and for all purposes.

STATEMENT OF GOVERNMENT INTEREST

This invention was made with U.S. Government support from the U.S. Armyunder subcontracts R401-SC-20316-0252 and R401-SC-20316-0273 (PrimeW15P7T-06-D-R401) and subcontract WRI-002 (PO 22713, PrimeW909MY-12-D-0008/0012). The U.S. Government has certain rights in theinvention.

BACKGROUND

The present teachings relate to hyperspectral imaging sensors andparticularly to hyperspectral imaging sensors having two or morespectrometers that operate over different spectral bands.

In some applications, spectral algorithms that process data from acombination of both spectral bands are used. Each spectrometer of thehyperspectral imaging sensor that operates in a particular bandtypically has the individual keystone distortions corrected within itsparticular band.

In those cases, the magnification and spatial distortion differencesbetween those spectrometers typically differ by amounts greater than apixel in some portions of the spatial field, making the spectral purityof data for a given object in the scene insufficient to provide reliableresults over the combined spectral bands.

There is a need for hyperspectral imaging sensors having spectrometersthat operate over different spectral bands and have increased fidelityfor the exploitation of spectral algorithms over their combined spectralbands.

SUMMARY OF THE INVENTION

The embodiments of the present invention provide a hyperspectral imagingsensor with increased fidelity for the exploitation of spectralalgorithms.

More specifically, the embodiments disclose and describe a hyperspectralimaging optical system made up of at least two individual spectrometers,each operating over a substantially different spectral band (e.g.visible and long-wave infrared). Although systems of this type, boththose with common aperture and those with independent apertures, havebeen developed, each of the spectrometers typically contribute data thatis processed using algorithms tailored to each of the individualspectral bands. For those skilled in the art, the spectral smile andkeystone distortions of each sensor play a significant role in thesensor's ability to provide spectrally pure data for a given object inthe scene. For this reason, these distortions are typically limited to afraction of a pixel.

To increase the fidelity of the sensor and provide better targetdiscrimination, spectral algorithms that process data from a combinationof both spectral bands can be utilized. While the individual keystonedistortions of the two systems may be well corrected within themselves,the magnification and spatial distortion differences between the twospectrometer systems typically differ by amounts greater than a pixel insome portions of the spatial field, making the spectral purity of datafor a given object in the scene insufficient to provide reliable resultsover their combined spectral bands.

For a better understanding of the present invention, together with otherand further objects thereof, reference is made to the accompanyingdrawings and detailed description.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic view of an embodiment of the present invention,taken along its optical axis in the plane parallel to the direction ofdispersion;

FIG. 2 is a schematic view of another embodiment of the presentinvention, taken along its optical axis in the plane parallel to thedirection of dispersion; and

FIG. 3 is a graph of the overlaid spatial distortion characteristics ofthe two sensors in the embodiment of the present invention described inFIG. 1 .

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

This invention relates to novel optical designs, which provide greaterspectral fidelity and performance than previous designs.

More specifically, the embodiments disclose and describe a hyperspectralimaging optical system made up of at least two individual spectrometers,each operating over a substantially different spectral band (e.g.visible and long-wave infrared). Although systems of this type, boththose with common aperture and those with independent apertures, havebeen developed, each of the spectrometers typically contribute data thatis processed using algorithms tailored to each of the individualspectral bands. For those skilled in the art, the spectral smile andkeystone distortions of each sensor play a significant role in thesensor's ability to provide spectrally pure data for a given object inthe scene. For this reason, these distortions are typically limited to afraction of a pixel.

To increase the fidelity of the sensor and provide better targetdiscrimination, spectral algorithms that process data from a combinationof both spectral bands can be utilized. While the individual keystonedistortions of the two systems may be well corrected within themselves,the magnification and spatial distortion differences between the twospectrometer systems typically differ by amounts greater than a pixel insome portions of the spatial field, making the spectral purity of datafor a given object in the scene insufficient to provide reliable resultsover their combined spectral bands.

Reference is made to FIG. 1 , which is a schematic view of an embodimentof the present invention 100. (Exemplary embodiments of components usedin FIG. 1 can be found in U.S. Pat. No. 9,885,606, corresponding to U.S.patent application Ser. No. 14/212,327, entitled COMPACT SPECTROMETERWITH HIGH SPECTRAL RESOLUTION, and filed on Mar. 14, 2014, and U.S. Pat.No. 9,568,737, entitled COMPACT COMMON APERTURE IMAGER SYSTEM, issued onFeb. 14, 2017, both of which are incorporated by reference herein intheir entirety and for all purposes.) Light from a source (not shown)located at the object plane (not shown) is incident upon an afocaloptical system 110, which is capable of substantially receiving thelight from the source and substantially collimating the light. Thissubstantially collimated light is then incident upon a beam splitter120, the preferred embodiment of which is, but not limited to, a planarbeam splitter, but in general is any method of separating light, byreflection, refraction, diffraction, transmission, or any combinationthereof, hereinafter referred to generally as a beam splitter, which iscapable of substantially transmitting a first portion of the light andcapable of substantially reflecting a second portion of the light. Thefirst portion of the light is then incident upon a first focusingoptical system 230, which is capable of substantially receiving thefirst portion of the light and substantially transmitting that light toa first spectrometer optical system 240. The first spectrometer opticalsystem 240 can be, without limitation, any spectrometer optical systemwhich substantially disperses and re-images a portion of the lightreceived from the first focusing optical system 230 to a focus position(hereinafter also referred to as an image plane) where a CCD array,phosphorescent screen, photographic film, microbolometer array, or othermeans of detecting light energy, hereinafter referred to generally as adetecting element 260, is located. (The image plane and the detectingelement have the same identifying number.) The second portion of thelight is incident upon a second focusing optical system 330 that iscapable of substantially receiving the second portion of the light andsubstantially transmitting that light to a second spectrometer opticalsystem 340. The second spectrometer optical system 340 can be, withoutlimitation, any spectrometer optical system which substantiallydisperses and re-images a portion of the light received from the secondfocusing optical system 330 to a focus position (hereinafter alsoreferred to as another image plane) where a detecting element 360 islocated.

Reference is made to FIG. 2 , which is a schematic view of an embodimentof the present invention 200. A first portion of light from a source(not shown) located at the object plane (not shown) is incident upon afirst focusing optical system 230, which is capable of substantiallyreceiving the first portion of the light and substantially transmittingthat light to an optional first spectrometer optical system 240. Thefirst spectrometer optical system 240 can be, without limitation, anyspectrometer optical system which substantially disperses and re-imagesa portion of the light received from the first focusing optical system230 to a focus position of a detecting element 260. A second portion oflight from a source (not shown) located at the object plane (not shown)is incident upon a second focusing optical system 330 that is capable ofsubstantially receiving the second portion of the light andsubstantially transmitting that light to an optional second spectrometeroptical system 340. The second spectrometer optical system 340 can be,without limitation, any spectrometer optical system which substantiallydisperses and re-images a portion of the light received from the secondfocusing optical system 330 to a focus position of a detecting element360.

Reference is made to FIG. 3 , which shows the spatial distortioncharacteristics of the combined first focusing optical system 230 andfirst spectrometer optical system 240 as a series of solid linesrepresenting different wavelengths in its spectral band and the combinedfirst focusing optical system 330 and first spectrometer optical system340 as a series of dashed lines representing different wavelengths inits spectral band. The variation within each of the individual seriesrepresents the keystone distortion of those individual sensors, whilethe overlap between the red and blue series represents the degree ofspatial distortion matching between the two hyperspectral systems.

In the embodiments illustrated in FIG. 1 and FIG. 2 , the spatialimaging characteristics of the first and second focusing optical systemsand hyperspectral optical systems are specifically designed tosubstantially match each other across the spatial field. In oneembodiment, this is accomplished by designing the first optical systemand then placing individual restrictions on the spatial fieldcharacteristics of the second optical system during the design process,thereby requiring the spatial distortion characteristics of the secondoptical system to substantially match or substantially minimize thedifference between that of the first optical system. This can beaccomplished, for example and without limitation, by varying the radiiof curvature, thickness, refractive index, etc. of one or more of theoptical elements in either system while constraining the desiredlocation of the image centroids at various spatial positions such thatthe difference between the distortion characteristics of the two systemsis substantially small relative to the size of the detecting elements ofone or both systems.

For sufficient spectral purity for the application of spectralalgorithms that might use data across both spectral bands, this matchingwould typically be limited to less than a pixel on the detector orequivalently, focal plane array. In another embodiment, the two systemsmay be designed simultaneously with the constraints of matched spatialdistortion characteristics, where the distortion characteristics of thetwo systems do not differ substantially relative to the size of thedetecting elements of one or both systems, or to a specific desiredspatial distortion profile. In addition this spatial distortion matchingcan be used to balance the individual keystone distortions of theindividual system to further reduce the combined spatial/spectraldistortion of the system.

For the purposes of describing and defining the present teachings, it isnoted that the term “substantially” is utilized herein to represent theinherent degree of uncertainty that may be attributed to anyquantitative comparison, value, measurement, or other representation.The term “substantially” is also utilized herein to represent the degreeby which a quantitative representation may vary from a stated referencewithout resulting in a change in the basic function of the subjectmatter at issue.

Although the invention has been described with respect to variousembodiments, it should be realized this invention is also capable of awide variety of further and other embodiments within the spirit andscope of the invention. For example, although the embodiment shownutilizes a common aperture design, it should be noted that the matchingof the spatial distortion characteristics between one or more sensors isnot restricted to systems with common apertures and/or entrance pupils,and can be applied to those systems having two or more independentapertures as well. It should additionally be noted that the spectrometersystems do not need to have the same focal lengths, fields of view,apertures, pixel sizes, or instantaneous fields of view as each other tostill benefit from the matched or minimized difference in spatialdistortion described in this invention. This invention is not limited tooptical systems having only two spectrometers but also applies tooptical systems have a plurality of spectrometers of spectral bands.Furthermore, any number of optical elements, reflective or refractive,comprising without limitation refractive, reflective, and/or diffractiveelements, can be used in the embodiments of the present invention, andany aspects of the embodiments of the present invention, including butnot limited to those shown, can be used in combination with one anotheras still further embodiments.

The invention claimed is:
 1. A dual imaging spectrometer optical systemcomprising: a first imaging optical sub-system having at least oneoptical element; said first imaging optical sub-system being opticallydisposed to receive a first portion of light from a source; a firstspectrometer optical sub-system having at least one optical element;said first spectrometer optical sub-system configured to substantiallyreceive light from said first imaging optical sub-system; said firstspectrometer optical sub-system being configured to disperse said lightreceived from said first imaging optical sub-system and imaging saiddispersed light onto a first image plane; said first imaging opticalsub-system and said first spectrometer optical sub-system comprising afirst combined imaging spectrometer optical system having a firstspatial distortion characteristic; a second imaging optical sub-systemhaving at least one optical element; said second imaging opticalsub-system being optically disposed to receive a second portion of lightfrom a source; a second spectrometer optical sub-system having at leastone optical element; said second spectrometer optical sub-systemconfigured to substantially receive light from said second imagingoptical sub-system; said second spectrometer optical sub-system beingconfigured to disperse said light received from said second imagingoptical sub-system and imaging said dispersed light onto a second imageplane; said second imaging optical sub-system and said secondspectrometer optical sub-system comprising a second combined imagingspectrometer optical system having a second spatial distortioncharacteristic; and said first spatial distortion characteristic andsaid second spatial distortion characteristic being substantiallymatched.
 2. The dual imaging spectrometer optical systems of claim 1wherein said first portion of light and said second portion of light aresubstantially different spatial bands.
 3. The dual imaging spectrometerof claim 1 wherein said first portion of light and said second portionof light are substantially different polarizations.
 4. The dual imagingspectrometer optical systems of claim 1 wherein said second imagingoptical sub-system and said second spectrometer optical sub-system aredesigned to substantially minimize a difference between said first andsaid second spatial distortion characteristics.
 5. A method forproviding spectral fidelity and improving performance in sensors thatoperate in at least two spectral bands, the method comprising:configuring a first spectrometer, the first spectrometer operating in afirst spectral band, to have a first spatial distortion characteristic;configuring a second spectrometer, the second spectrometer operating ina second spectral band, to have a second spatial distortioncharacteristic; configuring the first spectrometer such that the firstspatial distortion characteristic has a predetermined relationship to asecond spatial distortion characteristic.
 6. The method of claim 5wherein the first spatial distortion characteristic and a second spatialdistortion characteristic are substantially matched.
 7. The method ofclaim 5 wherein a difference between the first and second spatialdistortion characteristics is substantially minimized.
 8. An imagingoptical system comprising: a first imaging optical sub-system having atleast one optical element; said first imaging optical sub-system beingoptically disposed to receive light from a source; a first spectrometeroptical sub-system having at least one optical element; said firstspectrometer optical sub-system configured to substantially receivelight from said first imaging optical sub-system; said firstspectrometer optical sub-system being configured to disperse said lightreceived from said first imaging optical sub-system and imaging saiddispersed light onto a first image plane; said first imaging opticalsub-system and said first spectrometer optical sub-system having acombined first spatial distortion characteristic; said combined firstspatial distortion characteristic being substantially matched to acombined second spatial distortion characteristic; the combined secondspatial distortion characteristic corresponding to a combination of asecond imaging optical sub-system and a second spectrometer opticalsub-system, the second imaging optical sub-system being opticallydisposed to receive light from a source, the second spectrometer opticalsub-system configured to substantially receive light from the secondimaging optical sub-system.
 9. The imaging optical system of claim 8wherein a difference between said combined first spatial distortioncharacteristic and the combined second spatial distortion characteristicis substantially minimized.
 10. A multiple imaging optical systemcomprising: a plurality of imaging optical sub-systems; each imagingoptical sub-system in said plurality of imaging optical sub-systemshaving at least one optical element; said each imaging opticalsub-system in said plurality of imaging optical sub-systems beingoptically disposed to receive a portion of light from a source; aplurality of image planes; a plurality of spectrometer opticalsub-system; each spectrometer optical sub-system in said plurality ofspectrometer optical sub-systems having at least one optical element;said each spectrometer optical sub-system in said plurality ofspectrometer optical sub-systems configured to substantially receivelight from at least one of said first imaging optical sub-systems insaid plurality of imaging optical subsystems; said each spectrometeroptical sub-system in said plurality of spectrometer optical sub-systemsbeing configured to disperse said light received from said at least oneof said first imaging optical sub-systems in said plurality of imagingoptical subsystems and imaging said dispersed light onto at least oneimage plane in said plurality of image planes; said each imaging opticalsub-system in said plurality of imaging optical sub-systems and said atleast one spectrometer optical sub-system in said plurality ofspectrometer optical sub-systems comprising a combined imagingspectrometer optical system in a plurality of combined imagingspectrometer optical systems; each combined imaging spectrometer opticalsystem in a plurality of combined imaging spectrometer optical systemshaving a spatial distortion characteristic in a plurality of spatialdistortion characteristics; at least one spatial distortioncharacteristic in said plurality of spatial distortion characteristicsbeing substantially matched to at least one other spatial distortioncharacteristic in said plurality of spatial distortion characteristics.11. The multiple imaging optical system of claim 10 wherein a differencebetween said combined at least one spatial distortion characteristic insaid plurality of spatial distortion characteristics being substantiallymatched to at least one other spatial distortion characteristic in saidplurality of spatial distortion characteristics is substantiallyminimized.